According to Verigy, the V93000 Direct-Probe solution delivershigh-performance functional testing at wafer probe at a significantly lowercost of test. By removing the conventional mechanical interface ...

Now, a team of researchers led by Professor Huang Xian from the School of Precision Instrument and Opto-electronics ...

Optimized for on-wafer test with the company's wafer probing stations, the system combines advanced navigation tools and video processing with next-generation digital microscope technology.

The new TESLA300 automates high-voltage and high-current IGBT and Power MOSFET device measurements on 300mm wafers to lower test costs and speed developmentLIVERMORE, Calif., March 03, 2022 (GLOBE ...

The EVOLVITY 300 simplifies on-wafer probing with its compact, easy-to-use design, developed specifically for RF/DC modeling and device characterization.

Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, to announce the availability of the ...

Korean memory chipmaker SK Hynix has adopted the Metron 3D 300 mm in-line wafer metrology system from Infinitesima. SK Hynix will use the technology in volume production as it provides 3D process ...

The system is designed to streamline on-wafer probing processes, particularly for RF/DC modeling and device characterization.

Infinitesima says that SK hynix, a full stack artificial intelligence (AI) memory provider, has adopted the Metron®3D 300mm ...

NORTH READING, Mass., March 31, 2025--Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, to ...