Now, a team of researchers led by Professor Huang Xian from the School of Precision Instrument and Opto-electronics ...

Scientists are striving to discover new semiconductor materials that could boost the efficiency of solar cells and other ...

Bright field imaging systems are widely used for inline inspection tools to detect with high sensitivity defects on patterned wafers in semiconductor fabrication processes. We expect to extend this ...

The sheet resistance of a silicon wafer with four point probes method is studied based on Labview software. With the help of data acquisition circuit and the Labview software programming, the ...

Conventional testing approaches face major limitations, with some methods damaging wafer surfaces irreversibly, while others ...

The testing method checks micro-LED wafers without damage. It uses soft probes and tools to improve yield, lower costs, and ...

Tianjin University scientists have developed a pioneering nondestructive testing technology for micro-LED wafers, offering a ...

Discover everything there is to know about Reverse Tip Sample Scanning Probe Microscopy (RTS SPM) and its main applications.

Cooling towers are vital in urban and industrial contexts but face challenges related to resource recovery, energy efficiency, and water scarcity within a circular economy. This study develops a mass ...

MilliBox the leader in compact benchtop mmWave and sub-THz antenna test systems continues to show innovation for the 2025 edition of the IEEE MTT-S International Microwave Symposium in San Francisco ...

The Park FX200 offers exceptional AFM precision for 200 mm samples, enabling high-resolution imaging and automated analysis for advanced research.

Pickering shares five expert-backed reasons reed relays outperform in wafer probe and parametric test environments Leading manufacturer of high performance reed relays, Pickering Electronics has ...