Now, a team of researchers led by Professor Huang Xian from the School of Precision Instrument and Opto-electronics ...

Scientists are striving to discover new semiconductor materials that could boost the efficiency of solar cells and other ...

Bright field imaging systems are widely used for inline inspection tools to detect with high sensitivity defects on patterned wafers in semiconductor fabrication processes. We expect to extend this ...

The sheet resistance of a silicon wafer with four point probes method is studied based on Labview software. With the help of data acquisition circuit and the Labview software programming, the ...

Conventional testing approaches face major limitations, with some methods damaging wafer surfaces irreversibly, while others ...

Operando X-ray spectroscopy is a powerful tool for probing electrocatalyst dynamics—but intense X-ray exposure can distort ...