Now, a team of researchers led by Professor Huang Xian from the School of Precision Instrument and Opto-electronics ...

Scientists are striving to discover new semiconductor materials that could boost the efficiency of solar cells and other ...

Conventional testing approaches face major limitations, with some methods damaging wafer surfaces irreversibly, while others ...

The testing method checks micro-LED wafers without damage. It uses soft probes and tools to improve yield, lower costs, and ...

Tianjin University scientists have developed a pioneering nondestructive testing technology for micro-LED wafers, offering a ...

Discover everything there is to know about Reverse Tip Sample Scanning Probe Microscopy (RTS SPM) and its main applications.

The Park FX200 offers exceptional AFM precision for 200 mm samples, enabling high-resolution imaging and automated analysis for advanced research.

"This not only preserves the wafer surface but also significantly extends the probe's service life ... the team also developed a custom-designed measurement system that integrates with the flexible ...

The EVOLVITY 300 simplifies on-wafer probing with its compact, easy-to-use design, developed specifically for RF/DC modeling and device characterization.

Company Expands the 300 mm Product Line with New Semi-Automated System Livermore, CA (GLOBE NEWSWIRE) - FormFactor, Inc. (NASDAQ: FORM), a supplier of electrical test and measurement technologies, has ...

Teradyne has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, to announce the availability of the first high-volume, double-sided wafer probe test cell ...