Now, a team of researchers led by Professor Huang Xian from the School of Precision Instrument and Opto-electronics ...

Conventional testing approaches face major limitations, with some methods damaging wafer surfaces irreversibly, while others ...

Tianjin University scientists have developed a pioneering nondestructive testing technology for micro-LED wafers, offering a ...

The testing method checks micro-LED wafers without damage. It uses soft probes and tools to improve yield, lower costs, and ...

Discover everything there is to know about Reverse Tip Sample Scanning Probe Microscopy (RTS SPM) and its main applications.

"This not only preserves the wafer surface but also significantly extends the probe's service life ... the team also developed a custom-designed measurement system that integrates with the flexible ...

Fortunately, dual-purpose analyzers that combine spectrum analysis and VNA are available now, which are designed with a mix ...

Challenges include probing fine-pitch micro-bumps and maintaining test access throughout 3D stacks. Solutions include ...

The Park FX200 offers exceptional AFM precision for 200 mm samples, enabling high-resolution imaging and automated analysis for advanced research.

Probe contact was investigated by modeling the scrub, penetration or deformation on a bump under various conditions of wafer probe and experimentally tested on wafers on copper pillars, solder bumps ...

CSBG is expected to grow at 1.5x the rate of the wafer fab equipment ... metrology, probe card testing and lithography, along with sophisticated yield-enhancing software. Its JetStep panel lithography ...