Now, a team of researchers led by Professor Huang Xian from the School of Precision Instrument and Opto-electronics ...

Conventional testing approaches face major limitations, with some methods damaging wafer surfaces irreversibly, while others ...

Challenges include probing fine-pitch micro-bumps and maintaining test access throughout 3D stacks. Solutions include ...

The sheet resistance of a silicon wafer with four point probes method is studied based on Labview software. With the help of data acquisition circuit and the Labview software programming, the ...

Scientists are striving to discover new semiconductor materials that could boost the efficiency of solar cells and other ...

Operando X-ray spectroscopy is a powerful tool for probing electrocatalyst dynamics—but intense X-ray exposure can distort ...

Utilizing IR PiFM, researchers can accurately analyze contaminants and defects under 20 nm, enhancing surface ...

Stay updated on the latest artificial intelligence news and developments with Fox Business. Get real-time insights and expert analysis on AI innovations, applications, and their impact on ...

Sholay, an action-driven movie laced with violence, was released almost simultaneously the mythological super hit Jai ...

If PCBs aren’t tested, errors and defects missed during the manufacturing process could eventually lead to malfunctions and product failures in the field. After a PCB board is manufactured and ...

Bright field imaging systems are widely used for inline inspection tools to detect with high sensitivity defects on patterned wafers in semiconductor fabrication processes. We expect to extend this ...

Discover how the new technique of HSMP can help scientists gain insights into the world of biological processes and their ...