A new technical paper titled “Defect Analysis and Built-In-Self-Test for Chiplet Interconnects in Fan-out Wafer-Level ...

A lab mistake led to self-forming spiral patterns on metal surfaces, revealing chemical-mechanical interactions.

Extreme ultraviolet (EUV) lithography is at the center of next-generation semiconductor manufacturing as it enables smaller ...

The social network X suffered intermittent outages on Monday, a situation owner Elon Musk attributed to a “massive cyberattack.” Musk said in an initial X post that the attack was perpetrated ...

In the past, debug was performed using laser voltage imaging through the backside of the silicon wafer. “On the advanced logic side ... and it depended on the engineers to manually map and then ...

Google Maps has recently been experiencing frequent malfunctions, especially in busy urban areas. Many drivers have encountered misguided directions, such as being steered into narrow lanes to ...

Abstract: Wafer map defect recognition is a crucial step in semiconductor manufacturing and measurement. Semisupervised domain adaptation (SSDA) aims to leverage abundant labeled data in the source ...

It showed a map with lines connecting Glasgow to Marseille, Cardiff to Calais, and train lines stretching to dozens of European destinations including Naples, Lisbon and Copenhagen.