Utilizing IR PiFM, researchers can accurately analyze contaminants and defects under 20 nm, enhancing surface ...

As competition intensifies, strategic supplier relationships, regional expansions, and R&D investments are key levers for ...

Semiconductor and compound semiconductor processing can cause subcritical faults that manifest themselves long after production, generally as field reliability difficulties. These costly latent ...

Until recently, most studies on subgap states focused on amorphous IGZO, as sufficiently large single-crystal IGZO (sc-IGZO) ...

Product security and reliability are major concerns in the semiconductor and PCB fabrication industries. Because of this, ...

Defect detection requirements on the order of 10 defective parts per million (DPPM) are driving improvements in inspection ...

Aluminum nitride ceramics have high thermal conductivity, with a thermal conductivity of up to 170-230W/ (m · K), which can quickly dissipate the heat generated during equipment operation, effectively ...

Next-generation optical inspection is about more than just sensitivity. It’s about reliably seeing through complexity.

The first results have been reported on a collaboration between ETH Zürich and Australia's Nuclear Science and Technology Organisation (ANSTO), looking at the impact of radiation on SiC devices for ...

When electronic devices overheat, they can slow down, malfunction, or stop working altogether. This heat is mainly caused by ...