By combining high-resolution microscopy with ultrafast laser pulses, physicists can spot single-atom “defects” on a semiconductor surface.

Standard manufacturing techniques for semiconductor devices—the technologies that make electronics possible—involve processing raw materials at high temperatures in vacuum vessels. This ...

Utilizing IR PiFM, researchers can accurately analyze contaminants and defects under 20 nm, enhancing surface ...

Many displays found in smartphones and televisions rely on thin-film transistors (TFTs) made from indium gallium zinc oxide ...

Until recently, most studies on subgap states focused on amorphous IGZO, as sufficiently large single-crystal IGZO (sc-IGZO) ...

Semiconductor and compound semiconductor processing can cause subcritical faults that manifest themselves long after production, generally as field reliability difficulties. These costly latent ...

KLA explores how nanoidenters can help reduce defects in semiconductor films.

Defects in two-dimensional materials (such as an atom-thick sheet of graphene) can dramatically alter the way that the surface ripples, even stopping the sheet in place like a freeze frame.

Semiconductor manufacturers have previously introduced inspection systems for detecting surface defects on glass substrates, but this is the industry's first system capable of inspecting both the ...

Onto Innovation Inc. (NYSE: ONTO) today announced the release of a new sub-surface inspection capability for the Dragonfly® G3 sub-micron 2D/3D inspec ...

Carbon nanotubes present a game-changing solution for preventing defects in EUV lithography, supporting the semiconductor industry's drive toward extreme miniaturization and improved chip reliability.