Chinese researchers have discovered the leading cause of defects in the promising semiconductor material gallium nitride (GaN). This material is critical for developing advanced electronics ...

Researchers in China say they have pinpointed the main cause of defects in a semiconductor material considered key to boosting the performance of advanced chips used in electronic warfare and ...

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a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge "cold field emission" (CFE) technology for high ...