The majority of semiconductor devices are made up of heterostructures, which are stacked layers of distinctive materials deposited by utilizing distinctive methods. These layers have a thickness in ...

The exact birth of the scanning microscope principle is not clear, as the work of numerous scientists contributed to its inception. However, it is generally accepted that the first scanning microscope ...

The technique of dopant profiling using scanning electron microscopy (SEM) has emerged as a vital tool in semiconductor research, enabling rapid, contactless and high‐resolution analysis of dopant ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...

From smartphones to autonomous cars to AI supercomputers, nearly every electronic innovation we use today depends on complicated structures at the atomic scale within silicon chips. As these chips ...

For decades, optical microscopy has been restricted by diffraction limits, making it difficult to resolve nanostructures. Electron microscopy (EM) is the current standard for high-resolution imaging, ...

As semiconductor process geometries shrink to the 32-nm node and below, obtaining clear images and data of critical IC structures is becoming a lot tougher using traditional SEMs (scanning electron ...

Accelerating the expansion of digitalized assets and the deployment of Lumada 3.0 with a focus on the semiconductor field through the launch of a flagship model TOKYO, Oct 31, 2025 - (JCN Newswire) - ...

According to [Asianometry], no one believed in the scanning electron microscope. No one, that is, except [Charles Oatley].The video below tells the whole story. The Cambridge graduate built radios ...

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Hillsboro, OR. For semiconductor manufacturers seeking fast, high-quality electrical and physical failure analysis, Thermo Fisher Scientific today announced three new additions to its portfolio of ...