Researchers have built a computer from scratch without silicon, a “milestone” in showing that it is possible to one day ...

The JEOL JSM-6500F is a Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment, and Nanometer Pattern Generation Systems (NPGS). It offers high resolution images of ...

Making microchips for our electronics means doing some pretty detailed work. A big part of that is something called etching ...

A fully in-situ, optoelectronic mid-infrared filter using silicon metasurfaces and thermo-optic tunability can achieve ...

The Hitachi TM3000 Benchtop Scanning Electron Microscope (SEM) is easy to use compared to traditional SEMs and allows for observation of uncoated specimens in low vacuum mode. It can handle relatively ...

In proof-of-concept applications, including selective immunolabeling of breast cancer cells, the SiO 2 @QDs provided higher sensitivity and superior signal-to-background ratios whether using ...

The Ulvac Technology MILA 3000 Rapid Thermal Annealing (RTA) vacuum furnace is a programmable tabletop furnace for high temperature materials testing and analysis. It can heat samples to 1200°C in ...

Unlike its sister volume SEM techniques; serial block face SEM and focussed ion beam SEM, array tomography is non-destructive. The sections can be re-visited and re-imaged several times. If the ...

SEM topography preparation techniques Similarly to the ultrastructure preparations described above this technique ensures the preservation of fine ultrastructural details and stabilisation of the ...