In the vast reaches of the semiconductor cosmos, a silent menace lurks—one that can obliterate years of design work in a fraction of a nanosecond. Electrostatic discharge (ESD) verification stands as ...

A single layer of atoms may seem too thin to meaningfully interact with light, yet materials like tungsten disulfide are reshaping what is possible in nanophotonics. Researchers have now found a way ...

Yield loss from contamination demands more than detection. Learn how integrated inspection, materials analysis, and process correlation establish defensible root cause in semiconductor fabs.

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

AlScN can be lattice-matched to GaN and integrated into blue light-emitting diodes as the electron blocking layer ...

Crystalline nanomaterials are valuable because their highly ordered structures give them useful properties for technologies ...

A research team led by Dr. Jeong Min Park of the Nano Materials Research Division at the Korea Institute of Materials Science ...

Photo-induced force microscopy (PiFM) is a sophisticated nanoscale characterization approach that combines the elevated spatial resolution of atomic force microscopy (AFM) with infrared (IR) ...

The integration of metal nanoparticles with semiconductors to form Schottky-barrier junctions within hybrid nanostructures presents a unique opportunity to enhance phototherapeutic performance. Upon ...

Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that interfere with electrical flow. A joint research team has developed a new ...

New nickel-PTFE nanocomposite mold integrates lubricating particles directly into the matrix, achieving over 1,500 defect-free molding cycles without coatings for microfluidic devices. (Nanowerk News) ...