Abstract: Nowadays, serious lateral temperature gradient across the chip surface can significantly reduce the lifetime of the power semiconductor devices. Currently, the primary methods for extracting ...

Heterogeneous integration is more than a technical milestone—it’s a strategic enabler of the next wave of digital ...

Abstract: This article proposes a fast over-the-air (OTA) test method in a reverberation chamber (RC) for measuring the total isotropic sensitivity (TIS) of large-orm-factor wireless device. The ...