When contamination defects surface in advanced nodes, the root cause often spans tools, materials, and handling. This piece outlines how defect mapping, TEM, and SPC data converge to prove causation.

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

AlScN can be lattice-matched to GaN and integrated into blue light-emitting diodes as the electron blocking layer ...

A single layer of atoms may seem too thin to meaningfully interact with light, yet materials like tungsten disulfide are reshaping what is possible in nanophotonics. Researchers have now found a way ...

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March 6, 2026 • Instead of banning AI, why don't schools teach students to use it critically? College freshman Maximilian Milovidov shares what he has learned in an "AI writing" course at Columbia ...