Semiconductor Engineering2h
Early Detection Of C-RES Degradation On High-Current Power Planes
What is not dramatic is the hypothesized slow probe needle or contactor degradation process that might precede catastrophic ...
Silicon Semiconductor16h
Testing times for silicon photonics?
Clemens Leichtle, Director Center Of Expertise at Advantest, explains the strategic partnership which the company has with FormFactor to develop a novel test cell and measurement system designed for ...
Semiconductor Engineering1d
Wafer-Scale Computing for LLMs (U. of Edinburgh, Microsoft)
A Wafer-Scale LLM Inference System” was published by researchers at University of Edinburgh and Microsoft Research. Abstract ...
Silicon Semiconductor6d
Probe card market to grow by $1.73 billion
Report on how AI is driving market transformation - The global probe card market size is estimated to grow by USD 1.73 ...