Hosted on MSN20d
Applied Materials (AMAT) Unveils AI-Powered Defect Review Tool for Advanced Chip ManufacturingA technician in a clean room assembling a semiconductor ... On February 19, it unveiled SEMVision™ H20, a defect review tool for enhancing the analysis of nanoscale defects in chips.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback