Abstract: SiC power MOSFETs guarantee high power density and high efficiency in new-generation power converters. The precise measurement of the device’s junction temperature is important in this ...
Abstract: High-voltage p-i-n diodes for space applications are sensitive to single event burnout (SEB), which may cause the failure of the entire electronic system. This article describes the SEB ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback