Intel begins test runs of advanced chips in Arizona, reports say
Though an Intel spokesperson would not comment on whether tests had started on its advanced computer chips, a company ...
Plast Europe15d
Laser marking masterbatches for clear plastics
The company’s centre for laser additives in Weitnau / Germany is equipped with lamp-pumped and diode-pumped Nd:YAG lasers for the development of formulations and for test marking finished articles.
Associated Press22d
French soccer makes special matchday jerseys to mark International Women’s Day
(AP Photo/Fred Scheiber) Toulouse’s Jaydee Canvot wears a jersey marking Women’s International Day during the French League One soccer match between Toulouse and Monaco Friday, March 7, 2025 at the ...
Semiconductor Engineering27d
Wafer-Level Test Infrastructure for Higher Parallel Wafer Level Testing of SoC
A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...
Associated Press29d
Millions of Muslims in Indonesia mark the start of the holy month of Ramadan
(AP Photo/Achmad Ibrahim) Indonesian Muslims perform an evening prayer called ‘tarawih’ marking the first eve of the holy fasting month of Ramadan, at Istiqlal Mosque in Jakarta, Indonesia, Friday, ...
Investing29d
Aehr Test Systems ships AI wafer burn-in system
FREMONT, CA - Aehr Test Systems, a global provider of semiconductor test and burn-in equipment, has announced the completion of its first FOX-XP™ wafer level burn-in system shipment to a customer in ...
Investing1mon
Aehr Test Systems ships AI wafer burn-in system
a global provider of semiconductor test and burn-in equipment, has announced the completion of its first FOX-XP™ wafer level burn-in system shipment to a customer in the artificial intelligence ...
IEEE1mon
Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip
High parallelism is a key factor in reducing costs during wafer-level testing. Wafer testing is conducted using Automatic Test Equipment (ATE) along with test infrastructures such as the Prober ...
PR Newswire1mon
Speakers at Inaugural SEMIEXPO Heartland Event to Highlight Advancements in Smart Manufacturing and Smart Mobility
This session will focus on these considerations and the current state-of-the-art in APT, including wafer testing, assembly, and final packaging. Robotics and Automation for APT Attendees will gain ...
NDTV1mon
NEET UG 2025 On May 4: Know Test Pattern And Marking Scheme
NEET UG 2025: The exam result will be tentatively declared by June 14. NEET UG 2025: The National Testing Agency (NTA) on February 7 opened the application window for the National Eligibility cum ...
Investing1mon
Laser Photonics expands chip marking technology R&D
The high-precision Laser Wafer Marking technologies are essential for engraving serial numbers and other vital information on silicon and compounds, which are crucial in the semiconductor industry.