Thank you, and welcome, everyone to FormFactor's Fourth Quarter 2024 Earnings Conference Call. On today's call are Chief Executive Officer, Mike Slessor; and Chief Financial Officer, Shai Shahar.

By integrating inspection and test results into a closed-loop system, manufacturers can address excursions ... and the inherent mismatch between round wafers and rectangular probe arrays all ...

The HITS ™ is a semi-automatic test system for chiplets, advanced packages, and thin film materials tests. The HITS ™ leverages Xallent's fine pitch probe cards, automation software ...

ERS electronic, the industry leader of thermal management solutions for semiconductor manufacturing, celebrated the official opening of ERS Barbing, its new state-of-the-art production and R&D ...

Finally, I mentioned functional testing earlier. Functional testing at wafer probe, what we call ‘system-like testing,’ is becoming more critical. It allows us to identify known good die as early as ...

For the growth of thin films, the introduction of instrumentation began with ‘traditional’ pressure and temperature measurement sensors. This has now expanded to include optical techniques – both ...

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On Jan 15th, 2025, small-diameter double shield TBM “CREC 1477” completed its FAT in Zhengzhou city, Henan province, China.

For instance, as per Invest India, India registered USD 30 billion in financial stimulus for Electronics System Design and Manufacturing (ESDM) and related sectors. This, in turn, is having a ...

Probe cards play a crucial role in this process, providing electromechanical interfaces for chip testing. These advanced tools measure electrical signals between silicon wafers and probes, ensuring ...

Nature Research Intelligence Topics enable transformational understanding and discovery in research by categorising any document into meaningful, accessible topics. Read this blog to understand ...

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