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Interesting Engineering on MSNResearchers unveil world’s first soft probe for non-destructive micro-LED testingNow, a team of researchers led by Professor Huang Xian from the School of Precision Instrument and Opto-electronics ...
Conventional testing approaches face major limitations, with some methods damaging wafer surfaces irreversibly, while others ...
Semiconductor testing application guide demonstrates the power of reed relays in modern test systems
Leading manufacturer of high performance reed relays, Pickering Electronics has announced availability of another in its ...
Alumina ceramics play an important role in semiconductor equipment due to their high hardness, good insulation, and stable ...
TAIPEI (Taiwan News) — Taiwan’s stock market ended lower on Tuesday as investor sentiment was weighed down by uncertainty ...
The team has developed a new soft-touch testing system that uses a flexible 3D probe array capable of adapting to the wafer’s microscopic surface, while applying a pressure as low as 0.9 MPa ...
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