Upgrades to Keysight’s double-pulse test systems bring easier and even higher-accuracy measurement of dynamic characteristics ...

Wafer testing is conducted using Automatic Test Equipment (ATE) along with test infrastructures such as the Prober Interface Board (PIB), signal tower, and probe card. In this paper, we present the ...

From thinning and trimming to bonding and debonding, 3D package quality is built on precise and extremely thin wafer ...

Global chip giant Nvidia is extending its AI dominance beyond cloud computing into edge AI markets, announcing at GTC 2025 collaborations with Cisco and T-Mobile to develop AI-native 6G wireless ...

A differential probe, a device for measuring the voltage between two points in a circuit rather than the voltage between a point and ground, it an extremely useful addition to any electronics bench.

Abstract: We evaluate the accuracy of small-signal on-wafer device characterization in the sub-THz frequency ... experiment are mainly attributed to the influence of microwave probes. When performing ...

As a result, test systems struggle to keep up. “A wafer contains over 100,000 signal pins, which are getting smaller and more densely packed. This makes designing a probe card extremely challenging, ...

Takaya APT-2400F/APT-2600FD Series flying probe, for inspection of high-density circuit boards, has a unique control mechanism and sensing technology and user-friendly interface said to reduce the ...