Metrology tools combined with wafer inspection capabilities are able to ensure that they target physical and electrical properties of semiconductor devices under production. Wafer metrology is able to ...

market is poised for substantial growth, fueled by increasing demand for advanced electronic devices, the rapid adoption of electric vehicles ...

E-beam inspection is one of two ways to find defects on a wafer. Optical inspection is the other method. Not long ago, chipmakers mainly used optical tools for defect detection in production. E-beam ...

CAD Rendering of the Final Assembly of Project SWCFI (Silicon Wafer Center-Finding Improvement). This project explores improving the inspection process of silicon wafers for quality control in the ...

SEOUL, KOREA – Koh Young Technology has established a subsidiary in Taiwan, it announced on the 10th. The strategy aims to strengthen partnerships and technological competitiveness with local clients, ...

Koh Young has developed the Meister Series and ZenStar, advanced metrology and inspection solutions tailored for the semiconductor industry. These systems are purpose-built to address the demanding ...