Metrology tools combined with wafer inspection capabilities are able to ensure that they target physical and electrical properties of semiconductor devices under production. Wafer metrology is able to ...

As one of the most popular tools used today to analyze data in the semiconductor manufacturing process, wafer-mapping software is capable of calculating reasons of yield loss, as well as identify the ...

TASMIT Inc. has launched a new inspection system for glass substrates as part of its INSPECTRA® series of semiconductor wafer ...

ASML and Imec this week established a five-year partnership designed to enable Imec's researchers and developers access to ...

CAD Rendering of the Final Assembly of Project SWCFI (Silicon Wafer Center-Finding Improvement). This project explores improving the inspection process of silicon wafers for quality control in the ...