We developed 4Pi-SIM, which integrates 4Pi microscopy with structured illumination microscopy to achieve isotropic optical resolution through interference in both illumination and detection.

The ZEISS Xradia Versa family is the latest generation of 3D X-ray microscopy (XRM) solutions optimized for non-destructive micro tomography. ZEISS 515 Versa advances industry and science with a ...

Delivering a presidential address to General Synod in 2021, Archbishop Stephen Cottrell reaffirmed the goal of the Church of England’s national vision and strategy. It was a strategy for growth, he ...