Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

Lab architecture used to test 2D semiconductors artificially boosts performance metrics, making it harder to assess whether these materials can truly replace silicon.

Nvidia Corporation stays the AI infrastructure leader with full-stack platforms and new GPUs; click to review NVDA growth, ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Beyond defence, GaN also has strong civilian potential. “GaN can handle more current and switch at higher frequency, which reduces the size and weight of power systems,” Gupta said, noting that ...

Nanoscale molybdenum disulfide memristors integrated onto standard CMOS chips achieve the lowest switching voltage reported ...

CD Projekt Red's Cyberpunk 2077 is something special, but fans of the open-world RPG have a few other games they should check ...

Scientists at the University of Tokyo have captured something never seen before: a frame-by-frame view of how electron spins ...

From quartz sand to silicon wafers, the manufacturing process is critical for achieving the purity and quality needed for ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Analog designers tend to stick with a component that they have used successfully, even if it’s a few years old and could easily be replaced.

What design considerations are there for 3D IC packaging? How do issues like thermal design differ with 3D IC packages? 3D IC ...