By combining high-resolution microscopy with ultrafast laser pulses, physicists can spot single-atom “defects” on a semiconductor surface.

Utilizing IR PiFM, researchers can accurately analyze contaminants and defects under 20 nm, enhancing surface ...

More information: Hsien-Nung Wang et al, Solution-processable ordered defect compound semiconductors for high-performance electronics, Science Advances (2024). DOI: 10.1126/sciadv.adr8636 ...

The G200X Semi Pack is a high-performance hardware and software bundle optimized for semiconductor and compound semiconductor applications. The Semi Pack includes the most well-known methods for ...

Until recently, most studies on subgap states focused on amorphous IGZO, as sufficiently large single-crystal IGZO (sc-IGZO) ...

KLA explores how nanoidenters can help reduce defects in semiconductor films. ... The G200X accomplishes this by inserting a conical or wedge-shaped diamond tip into the top surface layer, ...

A new solution deposition process for semiconductors yields high-performing transistors by introducing more defects, counterintuitively. Researchers used these devices to construct high- speed ...

Many displays found in smartphones and televisions rely on thin-film transistors (TFTs) made from indium gallium zinc oxide ...

TASMIT aims to supply the large glass substrate inspection system to manufacturers of advanced semiconductors, such as PLP, targeting 1 billion yen in orders in FY2025 and 2 billion yen in FY2030.

Onto Innovation Inc. (NYSE: ONTO) today announced the release of a new sub-surface inspection capability for the Dragonfly® G3 sub-micron 2D/3D inspec ...

Carbon nanotubes present a game-changing solution for preventing defects in EUV lithography, supporting the semiconductor industry's drive toward extreme miniaturization and improved chip ...