The EVOLVITY 300 simplifies on-wafer probing with its compact, easy-to-use design, developed specifically for RF/DC modeling and device characterization.

Teradyne has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, to announce the availability of the first high-volume, double-sided wafer probe test cell ...

The introduction of the double-sided wafer probe test cell is expected to have a significant impact on the silicon photonics and CPO market.

A combination of many tools from a variety of sources is needed to test and verify on-wafer RF devices.

Functional testing at wafer probe, what we call ‘system-like testing,’ is becoming more critical. It allows us to identify known good die as early as possible in the flow, which has tremendous ...

During Z-axis probing operations, there's a consistent microstep difference between the trigger position and the halt position that should not be present, depending on driver microstep settings and ...

Finally, we successfully demonstrated the assembly of tunable crystal patterns on a wafer-scale with great control on fluorocarbon-coated wafers, which is promising in microelectronics, bead-based ...

A wafer probe is an essential feed for an integrated antenna during a measurement. The wafer probe radiates from its unshielded tips, which limits the minimum measurable gain of an antenna under test ...