Abstract: Wafer maps of large-scale integration chips are matrices showing the defective chip position on a wafer. Determining defect patterns on wafer maps is crucial because these patterns indicate ...
A new technical paper titled “DECOR: Deep Embedding Clustering with Orientation Robustness” was published by researchers at Oregon State University and Micron Technology. “In semiconductor ...
Abstract: Wafer map defect pattern recognition is an indispensable component of semiconductor manufacturing, providing crucial information for identifying the root causes of defects in semiconductor ...
The lapping process involves thinning wafers from the back with a rotating abrasive surface. It is important to receive precise feedback as the process is carried out to monitor the quantity of ...
Following Flipkart’s Big Billion Days and Amazon’s Great Indian Festival, the Department of Consumer Affairs (DoCA) has stepped up scrutiny of both platforms over alleged “dark patterns,” including ...
Trying to document how single brain cells participate in networks that govern behavior is a daunting task. Brain probes called Neuropixels, which feature high-density silicon arrays, have enabled ...
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