These interruptions in periodicity include surfaces of materials, interfaces between materials, extended defects such ... family of III-N semiconductors and their alloys), novel semiconductors for ...

aerospace Researchers in China say they have pinpointed the main cause of defects in a semiconductor material considered key ...

a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge "cold field emission" (CFE) technology for high ...

the edition of a new enriched and updated monograph dedicated to these two very topical II-VI semiconductor compounds, covering all their most prominent, modern and fundamental aspects, seemed very ...

Researchers are harnessing the power of tiny defects in an incredibly thin material to one day make computer chips that are faster and more efficient than traditional silicon semiconductor platforms.