The Wafer XRD 300 stands as an ultra-fast, high-precision metrology module designed for crystal orientation and wafer geometry control. Introducing the Wafer XRD 300: a high-speed X-Ray diffraction ...

It sat inside of a big box whose job was to take silicon wafers in on one side and spit out integrated circuits on the other. [BrendaEM] never really divulges how she got her hands on something so ...

Due to this, an intentional offcut is imparted on SiC substrates to protect the underlying 4H-SiC crystal and allow the defects to have a predictable orientation ... both Si and SiC wafers ...

For that reason, the direct epitaxial growth of high-quality III-V optical gain materials selectively on large-size silicon photonics wafers remains a highly sought-after objective.” The large ...