Vacancy-type point defects, i.e., defects where one or several atoms are missing from a lattice site, are often present in rather high concentrations in semiconductors and insulators due to their ...

Because the particles can be followed one-by-one, defects can be studied at the particle scale. (Image ... to control the carrier concentration and type (n-type or p-type) in semiconductors. For ...

went searching for such a spin in the popular semiconductor gallium nitride and found it, surprisingly, in two distinct species of defect, one of which can be manipulated for future quantum ...

Capture Cross Section: A measure of the probability of a particle (electron or hole) being captured by a defect in a semiconductor material. Deep Traps: Energy levels within the bandgap of a ...

AI is exceptionally good at spotting anomalies in semiconductor inspection. The challenge is training different models for ...

Dr. Mooney was chair of the Gordon Research Conference on Defects in Semiconductors, organized symposia at MRS meetings, and has served on the program committees of numerous other conferences. She was ...

The semiconductor industry continues to grow in ... or the introduction of a dust particle that lands on the wafer during processing. These defects can cause a metal open or shorts. As feature sizes ...

Here, KLA Instruments ™ introduces the Nano Indenter ® G200X Semi Pack, a versatile tool for materials characterization for ...

Another critical aspect of semiconductor nanostructures is the stability of point defects, which can significantly affect electronic properties. A study on GaAs/AlGaAs superlattices found that ...

This can limit their use in applications, such as LEDs, where high order and low density of defects are needed. Normally, these highly ordered semiconductors require high processing temperatures.