Vacancy-type point defects, i.e., defects where one or several atoms are missing from a lattice site, are often present in rather high concentrations in semiconductors and insulators due to their ...

By varying crystal growth and processing conditions, the effects of crystalline defects and impurities at surfaces, interfaces and in the bulk semiconductor can be investigated and often enhanced or ...

Here, KLA Instruments ™ introduces the Nano Indenter ® G200X Semi Pack, a versatile tool for materials characterization for ...

1: Data flow that enables identification of the most critical defects and selecting chips for failure analysis date ... “We went all-in on semiconductors because of the accuracy, control, and ...

AI is exceptionally good at spotting anomalies in semiconductor inspection. The challenge is training different models for ...

Carbon nanotubes present a game-changing solution for preventing defects in EUV lithography, supporting the semiconductor industry's drive toward extreme miniaturization and improved chip reliability.

This finding underscores the complexity of radiation interactions with semiconductor materials. Another study focused on the electronic properties of defects formed at the SiO2/Si interface in ...

Dr. Mooney was chair of the Gordon Research Conference on Defects in Semiconductors, organized symposia at MRS meetings, and has served on the program committees of numerous other conferences. She was ...