Chinese researchers have discovered the leading cause of defects in the promising semiconductor material gallium nitride (GaN). This material is critical for developing advanced electronics ...

Topological materials are revolutionizing semiconductor manufacturing, offering enhanced conductivity and efficiency for next ...

More information: Volodymyr Shamraienko et al, Weak Spots in Semiconductor Nanoplatelets: From Isolated Defects Toward Directed Nanoscale Assemblies, Small (2024). DOI: 10.1002/smll.202411112 ...

Defects can occur in every step of the chip ... has emerged as a key contributor to the field of semiconductor testing. He has 24 years of experience in semiconductor testing.

Semiconductor manufacturers have previously introduced inspection systems for detecting surface defects on glass substrates, but this is the industry's first system capable of inspecting both the ...