that can trigger revolutionary approaches to control the defect states," says semiconductor and nanophotonics specialist Prof. Chang-Hee Cho of the DGIST team. "We now hope to develop new ...

Chinese researchers have discovered the leading cause of defects in the promising semiconductor material gallium nitride (GaN). This material is critical for developing advanced electronics ...

Failure analysis (FA) is an essential step for achieving sufficient yield in semiconductor manufacturing, but it’s struggling ...

More information: Volodymyr Shamraienko et al, Weak Spots in Semiconductor Nanoplatelets: From Isolated Defects Toward Directed Nanoscale Assemblies, Small (2024). DOI: 10.1002/smll.202411112 ...

Defects can occur in every step of the chip ... has emerged as a key contributor to the field of semiconductor testing. He has 24 years of experience in semiconductor testing.

a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge "cold field emission" (CFE) technology for high ...

Semiconductor manufacturers have previously introduced inspection systems for detecting surface defects on glass substrates, but this is the industry's first system capable of inspecting both the ...