“In this study, we applied the PointRend (Point-based Rendering) method to semiconductor defect segmentation. PointRend is an iterative segmentation algorithm inspired by image rendering in computer ...
By applying advanced AI image recognition ... positions Applied Materials as a leader in advanced defect review technology for semiconductor manufacturers, enhancing their capabilities in ...
By varying crystal growth and processing conditions, the effects of crystalline defects and impurities at surfaces, interfaces and in the bulk semiconductor can be investigated and often enhanced or ...
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