AI is exceptionally good at spotting anomalies in semiconductor inspection. The challenge is training different models for ...

By varying crystal growth and processing conditions, the effects of crystalline defects and impurities at surfaces, interfaces and in the bulk semiconductor can be investigated and often enhanced or ...

Any mature process has to be a control circuit which is constantly fed back with process defect misses. Root Cause Analysis (RCA) is a commonly used to tool identify process loopholes. Corrective ...

Carbon nanotubes present a game-changing solution for preventing defects in EUV lithography, supporting the semiconductor industry's drive toward extreme miniaturization and improved chip reliability.