The JEOL JSM-6500F is a Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment, and Nanometer Pattern Generation Systems (NPGS). It offers high resolution images of ...

Researchers have built a computer from scratch without silicon, a “milestone” in showing that it is possible to one day ...

The low-cost, scalable technology enables seamless integration of high-speed gallium nitride transistors onto a standard ...

In a bold challenge to silicon s long-held dominance in electronics, Penn State researchers have built the world s first ...

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

Advantest basically leads in semiconductor testing, dominating the market with Teradyne. This essentially gives ATEYY a high-barrier-to-entry and strategic duopoly that supports advanced ...

If you want to build semiconductors at home, it seems like the best place to start might be to find a used scanning electron microscope on eBay. At least that’s how [Peter Bosch] kicked off h… ...

About Carl Zeiss Carl Zeiss AG, a leader in electron microscopy, continues to enhance its technology and global presence. In October 2024, the company launched the ZEISS Crossbeam 550 Samplefab, an ...

The continuous miniaturization of semiconductor patterns improves performance but also leads to frequent pattern disruptions that significantly reduce manufacturing yields. In the field, scanning ...

ZEISS announces the new ZEISS Crossbeam 550 Samplefab, a focused ion beam scanning electron microscope (FIB-SEM) optimized for fully automated preparation of transmission electron microscopy (TEM) ...

State-of-the-art innovation lab pushes the limits of advanced semiconductor applications. ZEISS recently opened the ZEISS Microscopy semiconductor applications lab in Dresden, a state-of-the-art ...