Science Daily

Scientists finally see the atomic flaws hiding inside computer chips

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...
AZoOptics

The Role of Microscopy in Semiconductor Failure Analysis

Not all defects are visible with the same microscope. Explore how resolution, contrast, and signal interpretation shape ...
AZoM

Root Cause Analysis of Contamination Defects in Semiconductor Manufacturing

Yield loss from contamination demands more than detection. Learn how integrated inspection, materials analysis, and process correlation establish defensible root cause in semiconductor fabs.
Hosted on MSN

IISER scientists develop ultra-thin electronic devices using novel 2D semiconductor

Researchers at the Indian Institute of Science Education and Research (IISER) Pune have developed ultra-thin electronic devices using a novel, two-dimensional semiconductor, Bismuth Oxyselenide ...
IEEE

Semiconductor SEM Image Defect Classification Using Supervised and Semi-Supervised Learning with Vision Transformers : Topic/category: Defect Inspection and Reduction

Abstract: Controlling defects in semiconductor processes is important for maintaining yield, improving production cost, and preventing time-dependent critical component failures. Electron beam-based ...