Researchers have built a computer from scratch without silicon, a “milestone” in showing that it is possible to one day ...

The JEOL JSM-6500F is a Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment, and Nanometer Pattern Generation Systems (NPGS). It offers high resolution images of ...

Making microchips for our electronics means doing some pretty detailed work. A big part of that is something called etching ...

A fully in-situ, optoelectronic mid-infrared filter using silicon metasurfaces and thermo-optic tunability can achieve ...

As few as five electrons in a semiconductor can exhibit collective behaviour, forming a “Coulomb liquid”, according to ...

The Hitachi TM3000 Benchtop Scanning Electron Microscope (SEM) is easy to use compared to traditional SEMs and allows for observation of uncoated specimens in low vacuum mode. It can handle relatively ...

Fully Self-Assembled Silica Nanoparticle–Semiconductor Quantum Dot Supra-Nanoparticles and Immunoconjugates for Enhanced Cellular Imaging by Microscopy and Smartphone Camera Ghinwa H. Darwish ...

The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...

SEM Imaging Techniques The interaction of the beam with the specimen results in various types of signals, i.e. secondary and backscattered electrons as well as radiation and photons. During microscope ...

Electron Microscopy; SEM topography preparation techniques ... SEM topography for tissues (pdf) pdf, 772.69 KB Last modified 29 June 2025. Contact The University of Gothenburg Box 100 405 30 ...