Mark Najarian, Product Marketing Manager Fab Solutions at Thermo Fisher Scientific, explains how, to deliver lab quality data ...

The exact birth of the scanning microscope principle is not clear, as the work of numerous scientists contributed to its inception. However, it is generally accepted that the first scanning microscope ...

Semiconductors are the foundation of modern-day technology, and improving their computing power is at the core of this dynamic industry. However, the mechanical performance also matters: adhesion of ...

As semiconductor chip technology advances towards nanometre and sub-nanometre scales, the demands becomes exponentially more ...

From smartphones to autonomous cars to AI supercomputers, nearly every electronic innovation we use today depends on complicated structures at the atomic scale within silicon chips. As these chips ...

Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the ...

According to [Asianometry], no one believed in the scanning electron microscope. No one, that is, except [Charles Oatley].The video below tells the whole story. The Cambridge graduate built radios ...

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...

For decades, optical microscopy has been restricted by diffraction limits, making it difficult to resolve nanostructures. Electron microscopy (EM) is the current standard for high-resolution imaging, ...

Within the meticulous and layered journey of manufacturing semiconductor wafers, which could encapsulate anywhere from hundreds to thousands of steps over one to two months, even a minor defect or ...

TOKYO, Sept. 09, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the release of its next-generation CD-SEM* E3660, engineered ...