The SU8600 represents Hitachi's latest Cold Field Emission SEM, integrating advanced imaging modes with three in-lens ...

Optimize SEM analysis with Broad Ion Beam Milling, a cutting-edge technique for preparing intricate specimens, ensuring ...

FlexSEM II offers high-resolution SEM imaging in a compact format, addressing cost and space challenges while enhancing ...

Experience powerful tabletop SEM technology with advanced imaging performance for research, industry, and educational applications.

Explore how advanced microscopy techniques help engineers ensure reliability in spacecraft materials for space missions.

This new whitepaper explores how advanced cross-sectional analysis of battery electrodes - using scanning electron microscopy ...

The method allows for the spatially resolved observation of transport processes in semiconductor devices.

Lunar impact glass becomes a mighty mountain in new 'Nanocosmos: Journeys in Electron Space' images (exclusive) ...

Berlin’s JEMA has unveiled a next-gen TEM suite under the ALISE project, led by Thermo Fisher’s Spectra Ultra microscope with ...

Earthquake faults deep in the Earth can glue themselves back together following a seismic event, according to a new study led ...

A major milestone has been reached at the Joint Lab for Electron Microscopy (JEMA) of the Humboldt-Universität zu Berlin and the Leibniz-Institut für Kristallzüchtung (IKZ): under the ERDF-funded ...

A major milestone has been reached at the Joint Lab for Electron Microscopy (JEMA) of the Humboldt-Universität zu Berlin and ...