Abstract: Amorphous InGaZnO (a-IGZO) thin-film transistors (TFTs) severely degrade under AC gate bias stress and AC drain bias stress, whose transfer curves respectively undergo positive shifts of 6.3 ...

We investigated the effects of rapid thermal annealing (RTA) on the dynamic characteristics of the InAs/GaAs ten-layer quantum dot (QD) laser. Improvements in the temperature stability of bandwidth ...