The first results of the ETH Zurich and ANSTO collaboration focused on silicon carbide (SiC) devices have been reported in ...

Utilizing IR PiFM, researchers can accurately analyze contaminants and defects under 20 nm, enhancing surface ...

The first results have been reported on a collaboration between ETH Zürich and Australia's Nuclear Science and Technology Organisation (ANSTO), looking at the impact of radiation on SiC devices for ...

Defects can show up in the clock trees that drive scan chains, and even inside blocks of scan cells, which may number in the ...

There is a growing need for brighter luminescent materials to improve the detection and imaging of biomarkers. Relevant contexts include low-abundance biomarkers and technology-limited applications, ...

A new photodetector design using platinum-infused diamond nanowires achieves record-breaking UV sensitivity and heat ...

Automated inspection systems play an important role in manufacturing to guarantee higher quality and reduce production costs. In the semiconductor manufacturing industry, assembly and testing ...

A new technical paper titled “Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing” was published by researchers at Infineon Technologies, University of Padova and ...

Key Takeaways: A new low-temperature technique using PFBT has been developed to repair sulphur vacancies in molybdenum disulfide (MoS₂), a key material for next-generation semiconductors. The method ...

Once a global leader, Samsung Electronics is losing in the fierce semiconductor race to dominate AI supplies. It’s also losing engineers, leaving the remaining staff to work long, intense shifts to ...

Metallic nanoparticles such as nickel are used in catalytic, sensing, and electronic applications, but health and environmental affects have not been fully investigated. While some metal nanoparticles ...

Defects in CdSe nanoparticles (NPs) have been studied within the framework of density functional theory (DFT) and time dependent DFT. Both vacancies and substitutional defects were examined and their ...