Not all defects are visible with the same microscope. Explore how resolution, contrast, and signal interpretation shape semiconductor failure investigations.

In the vast reaches of the semiconductor cosmos, a silent menace lurks—one that can obliterate years of design work in a fraction of a nanosecond. Electrostatic discharge (ESD) verification stands as ...

A single layer of atoms may seem too thin to meaningfully interact with light, yet materials like tungsten disulfide are reshaping what is possible in nanophotonics. Researchers have now found a way ...

Yield loss from contamination demands more than detection. Learn how integrated inspection, materials analysis, and process correlation establish defensible root cause in semiconductor fabs.

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

AlScN can be lattice-matched to GaN and integrated into blue light-emitting diodes as the electron blocking layer ...

Crystalline nanomaterials are valuable because their highly ordered structures give them useful properties for technologies ...

Abstract: In the defect detection of patterned wafers, optical images captured by inspection systems are affected by various noises, resulting in low signal-to-noise ratios in the obtained images, ...

Variation is becoming a bigger problem in multi-die assemblies with TSVs and hybrid bonding. Multi-modal approaches are required to test these devices. AI plays a role in improving defect capture rate ...

Abstract: The mathematical model, which describes the process of light absorption by the hybrid system "metallic nanoparticle – semiconductor quantum dot" is proposed in this work. The reason for the ...

A hidden-interface breakthrough pushes perovskite solar cells past 26% efficiency. (Representational image)GettyImages Researchers in China have unveiled a new way to significantly improve the ...