Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

Crystalline nanomaterials are valuable because their highly ordered structures give them useful properties for technologies ...

A defect in a semiconductor chip may be smaller than a human hair but can create big problems in your everyday life, from crippling your car's steering to making your laptop more susceptible to ...

When contamination defects surface in advanced nodes, the root cause often spans tools, materials, and handling. This piece outlines how defect mapping, TEM, and SPC data converge to prove causation.

(Nanowerk News) In the quest to design more efficient solar cells and light-emitting diodes (LEDs), a team of engineers has analyzed different types of defects in the semiconductor material that ...

Defect states refer to electronic energy levels that arise from imperfections or irregularities in the crystal structure of materials, particularly in semiconductors and insulators. These ...

Across the semiconductor industry, ensuring cleanrooms and mini-environments are sufficiently monitored for particle sizes down to 100 nm is a common practice. Most industries have adopted this ...

Sensors are used for detecting a range of phenomena, such as chemical, electrical, mechanical, radiant, magnetic or thermal changes or events. Today, most sensors are manufactured using semiconductor ...