Abstract: For 3D NAND memory, with continuous word line (WL) pitch scaling, deteriorated WL interference and the impact on triple-level cell (TLC) operation window are anticipated. However, as the WL ...
Abstract: Low-density parity-check (LDPC) codes have been widely adopted to guarantee data reliability in 3-D NAND flash memory. However, the iterative LDPC decoding algorithm leads to high-decoding ...
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