With the horizontal model for the modern IC supply chain, IC piracy may take place at untrusted foundry and assembly, by overproducing, shipping out-of-spec/defective devices, or reverse engineering.

Employing more stress testing at the wafer level improves quality while reducing burn-in time and cost. So why isn’t it ...

Defect detection requirements on the order of 10 defective parts per million (DPPM) are driving improvements in inspection ...

System-level test (SLT) has evolved into a necessary test insertion for high-performance processors and chiplets.

A well defined IC test setup and IC configuration is mandatory to provide EMC-related test reports of different vendors comparable and allows an objective product selection for end-users. Based on ...