The best candidate for next-generation magnetic devices—technology that can power, store, sense or transport information—may be, counterintuitively, antiferromagnets. Today, the most widely used ...

When contamination defects surface in advanced nodes, the root cause often spans tools, materials, and handling. This piece outlines how defect mapping, TEM, and SPC data converge to prove causation.

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

AlScN can be lattice-matched to GaN and integrated into blue light-emitting diodes as the electron blocking layer ...

A single layer of atoms may seem too thin to meaningfully interact with light, yet materials like tungsten disulfide are reshaping what is possible in nanophotonics. Researchers have now found a way ...

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