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Electron microscopy shows 'mouse bite' defects in semiconductors
Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...
Physicists in China have unveiled new clues to the origins of high-temperature superconductivity in an iron-based material just a single unit-cell thick. Led by Qi-Kun Xue and Lili Wang at Tsinghua ...
A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips. Researchers at Cornell University have achieved something chipmakers have ...
Tech Xplore on MSN
'Milestone' findings on imaging methods call for a closer look at battery microscopy
Transmission electron microscopes (TEMs) allow researchers at the forefront of energy technology to study next-generation ...
A study from the Research Center for Materials Nanoarchitectonics (MANA) has uncovered a theoretical mechanism showing how the electronic band structures of strongly correlated insulators can be ...
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