Nasdaq22d
Applied Materials Accelerates Chip Defect Review with Next-Gen eBeam System
At today’s most advanced nodes, optical inspection creates much denser defect maps, which can require as much as a 100X increase in the number of defect candidates delivered to eBeam review.
Nasdaq22d
Applied Materials Unveils SEMVisionâ„¢ H20 for Enhanced Nanoscale Defect Analysis in Semiconductor Manufacturing
At today’s most advanced nodes, optical inspection creates much denser defect maps, which can require as much as a 100X increase in the number of defect candidates delivered to eBeam review.